R. Symanczyk: search on Z-Library

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1

Study on the dynamic resistance switching properties of NiO thin films

C. Kügeler, R. Weng, H. Schroeder, R. Symanczyk, P. Majewski, K.-D. Ufert, R. Waser, M. Kund

Journal:

Thin Solid Films

Year:

2010

Language:

english

File:

PDF, 660 KB

english, 2010

2

On the geoarchaeology of Limyra (SW Anatolia)ânew insights into the famous Lycian city and its environs

Stock, Friederike, Seyer, Martin, Symanczyk, Anika, Uncu, Levent, BrÃ¼ckner, Helmut

Journal:

Year:

2020

File:

PDF, 6.94 MB

2020

3

Experimental observation of spatial structures due to current filament formation in silicon pin diodes

D. Jäger, H. Baumann, R. Symanczyk

Journal:

Physics Letters A

Year:

1986

Language:

english

File:

PDF, 346 KB

english, 1986

4

Properties of solitary current filaments in silicon pin diodes

H. Baumann, R. Symanczyk, C. Radehaus, H.-G. Purwins, D. Jäger

Journal:

Physics Letters A

Year:

1987

Language:

english

File:

PDF, 262 KB

english, 1987

5

Optical study of current filaments in pin diodes

R. Symanczyk, E. Pieper, D. Jäger

Journal:

Physics Letters A

Year:

1990

Language:

english

File:

PDF, 416 KB

english, 1990

6

Observation of spatio-temporal structures due to current filaments in Si pin diodes

R. Symanczyk, S. Gaelings, D. Jäger

Journal:

Physics Letters A

Year:

1991

Language:

english

File:

PDF, 373 KB

english, 1991

7

A Nonvolatile 2-Mbit CBRAM Memory Core Featuring Advanced Read and Program Control

Dietrich, S., Angerbauer, M., Ivanov, M., Gogl, D., Hoenigschmid, H., Kund, M., Liaw, C., Markert, M., Symanczyk, R., Altimime, L., Bournat, S., Mueller, G.

Journal:

IEEE Journal of Solid-State Circuits

Year:

2007

Language:

english

File:

PDF, 2.65 MB

english, 2007

8

[IEEE IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. - Tempe, Arizon, USA (Dec. 5, 2005)] IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. - Conductive bridging RAM (CBRAM): an emerging non-volatile memory technology scalable to sub 20nm

Kund, M., Beitel, G., Pinnow, C.-U., Rohr, T., Schumann, J., Symanczyk, R., Ufert, K., Muller, G.

Year:

2005

Language:

english

File:

PDF, 356 KB

english, 2005

9

Investigation of the Reliability Behavior of Conductive-Bridging Memory Cells

Symanczyk, R., Bruchhaus, R., Dittrich, R., Kund, M.

Journal:

IEEE Electron Device Letters

Year:

2009

Language:

english

File:

PDF, 346 KB

english, 2009

10

[IEEE 2007 IEEE Symposium on VLSI Circuits - Kyoto, Japan (2007.06.14-2007.06.16)] 2007 IEEE Symposium on VLSI Circuits - Time Discrete Voltage Sensing and Iterative Programming Control for a 4F2 Multilevel CBRAM

Schrogmeier, P., Angerbauer, M., Dietrich, S., Ivanov, M., Honigschmid, H., Liaw, C., Markert, M., Symanczyk, R., Altimime, L., Bournat, S., Muller, G.

Year:

2007

Language:

english

File:

PDF, 2.25 MB

english, 2007

11

[IEEE 2008 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2008.12.15-2008.12.17)] 2008 IEEE International Electron Devices Meeting - Carbon-based resistive memory

Kreupl, Franz, Bruchhaus, Rainer, Majewski, Petra, Philipp, Jan B., Symanczyk, Ralf, Happ, Thomas, Arndt, Christian, Vogt, Mirko, Zimmermann, Roy, Buerke, Axel, Graham, Andrew P., Kund, Michael

Year:

2008

Language:

english

File:

PDF, 652 KB

english, 2008

12

Equivalent circuit model for current filamentation in p-i-n diodes

Symanczyk, R., Jäger, D., Schöll, E.

Journal:

Applied Physics Letters

Year:

1991

Language:

english

File:

PDF, 644 KB

english, 1991

13

[IEEE 2006 Symposium on VLSI Circuits, 2006. Digest of Technical Papers. - Honolulu, HI, USA (June 15-17, 2006)] 2006 Symposium on VLSI Circuits, 2006. Digest of Technical Papers. - A Non-Volatile 2Mbit CBRAM Memory Core Featuring Advanced Read and Program Control

Honigschmid, H., Angerbauer, M., Dietrich, S., Dimitrova, M., Gogl, D., Liaw, C., Markert, M., Symanczyk, R., Altimime, L., Bournat, S., Mller, G.

Year:

2006

Language:

english

File:

PDF, 471 KB

english, 2006

14

Selection of Optimized Materials for CBRAM Based on HT-XRD and Electrical Test Results

Bruchhaus, Rainer, Honal, Matthias, Symanczyk, Ralf, Kund, Michael

Journal:

Journal of The Electrochemical Society

Year:

2009

Language:

english

File:

PDF, 862 KB

english, 2009

15

[IEEE 2007 Non-Volatile Memory Technology Symposium - Albuquerque, NM (2007.11.10-2007.11.13)] 2007 Non-Volatile Memory Technology Symposium - Conductive Bridging Memory Development from Single Cells to 2Mbit Memory Arrays

Symanczyk, R., Dittrich, R., Keller, J., Kund, M., Muller, G., Ruf, B., Albarede, P.-H., Bournat, S., Bouteille, L., Duch, A.

Year:

2007

Language:

english

File:

PDF, 434 KB

english, 2007

16

Methodological approach for dating harbor sediments by using luminescence dating—a case study in Ephesus, Western Turkey

Noprakrit, Prakrit, Symanczyk, Anika, Zöller, Ludwig, Brückner, Helmut, Stock, Friederike

Journal:

Archaeological and Anthropological Sciences

Year:

2018

Language:

english

File:

PDF, 8.92 MB

english, 2018

17

Correction to: Methodological approach for dating harbor sediments by using luminescence dating—a case study in Ephesus, Western Turkey

Noppradit, Prakrit, Symanczyk, Anika, Zöller, Ludwig, Brückner, Helmut, Stock, Friederike

Journal:

Archaeological and Anthropological Sciences

Year:

2018

Language:

english

File:

PDF, 313 KB

english, 2018

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